AFM - Raman - SNOM
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05.12.2012 NT-MDT’s presentation, was impressive as ever. For the first time the public was introduced to two completely new devices - SPECTRUM and OPEN, and a completely overhauled version of NEXT.
09.11.2012 NT-MDT welcomed 18 distributors from around the world and several representatives of NT-MDT headquarters including founder and president Dr. Victor Bykov. Dr. Yulia Alekseeva, ceo of the European branch office kicked off the meeting that contained a personal welcome from Dr. Bykov and was followed by input from several distributors to share their experiences
17.09.2012 NT-MDT took part in the Joint ISFD-11th-RCBJSF Symposium and demonstrated its opportunities and achievements.
28.08.2012 NT-MDT announces the first finalists of the annual international competition of AFM-images ProIMAGE Contest 2012!
08.08.2012 On the 20th – 21st of August, 2012, Prof. Dr. Alexander Kotlyar will hold the webinar “AFM imaging of DNA related structures”.
18.07.2012 On the 25th of July, 2012, Prof. Dr. Sergej Demokritov presents the webinar on Magnetic Force Microscopy in the NT-MDT webinar series.
17.07.2012 The new development of NT-MDT SOLVER Spectrum was recognized by the international journal Research & Development as one of the most technologically significant products of the year.
10.07.2012 NT-MDT announces the webinar “Tip Enhanced Raman Scattering. Approaching 10 nm spatial resolution in Raman imaging”. It will be held on July 17-18.
26.06.2012 NT-MDT Co. announces the ProIMAGE Contest 2012! The competition will be held from July 2 to September 28, 2012.
19.04.2012 The success of NT-MDT in global partnership
12.03.2012 NT-MDT invites everyone to the webinar “Tip-Enhanced Raman Scattering. Approaching 10 nm spatial resolution in Raman imaging” that will take place on March 20-21.
20.02.2012 ProIMAGE Contest, held by NT-MDT in 2011, has been successfully completed. NT-MDT congratulates Ph.D. student Denise Erb; her scan «Growth» became the winner of the Contest!
12.01.2012 New Affordable Scanning Probe Microscope with Advanced Capabilities
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