СОЛВЕР Nano
AFM - Raman - SNOM
Modular AFM
Automated AFM
Practical AFM
Practical AFM
 
Model line
NTEGRA Prima NTEFRA Prima – Modular SPM (AFM, STM) system.  NT-MDT - AFM-probes, atomic force microscope (AFM, HybriD Mode, STM, SPM, RAMAN, SNOM) NTEGRA Aura NTEGRA Aura – Modular LV AFM/MFM.  NT-MDT - AFM-probes, atomic force microscope (AFM, HybriD Mode, STM, SPM, RAMAN, SNOM)

NTEGRA Aura

AFM for studies in the conditions of
controlled environment, low vacuum,
external magnetic fields
NTEGRA Aura – Modular LV AFM/MFM.  NT-MDT - AFM-probes, atomic force microscope (AFM, HybriD Mode, STM, SPM, RAMAN, SNOM)
NTEGRA Catalogue (8 Мб)

General information

The Q-factor of the cantilever in vacuum increases, thus gaining the sensitivity, reliability and accuracy of “probe-sample” light forces measurements. At that, the change from atmosphere pressure to 10-2 Torr vacuum provides the tenfold gain of Q-factor. By further vacuum pumping, Q-factor reaches its plateau and changes insignificantly. Thus, NTEGRA Aura presents the optimal “price/quality” ratio: comparing to the high-vacuum devices it needs much less time – only one minute - to get the vacuum that is needed for the tenfold Q-factor increase. At the same time the system is compact and easy to operate and maintain. As the NTEGRA platform product, NTEGRA Aura has built-in closed loop control for all the axes, optical system with 1 µm resolution and ability to work with more than 40 different AFM methods.
Due to the open architecture, the functionality of NTEGRA Aura can be widen essentially: specialized magnetic measurements with external magnetic field (horizontal, up to +/-0.2T; vertical, up to +/-0.02T), high-temperature experiments (heating up to 3000 С with temperature maintaining precision of 0.050 С), etc.

Applications

NTEGRA Aura allows to carry out the research of surface characteristics with nanometric resolution and near-surface physical fields of various objects that can be placed into vacuum.

Interesting results obtained by Prof. Olga Kazakova on the graphene under various environments are given on the site NPL, UK.

 

Specification

Measuring modes and techniques

STM/ AFM (contact + semi-contact + non-contact) / Lateral Force Microscopy / Phase Imaging/Force Modulation/ Adhesion Force Imaging/ Magnetic Force Microscopy/ Electrostatic Force Microscopy/ Scanning Capacitance Microscopy/ Kelvin Probe Microscopy/ Spreading Resistance Imaging/ Lithography: AFM (Force and Current), STM

More info
 

Contact

Fulfill a special form to request additional information.

 
 
 
Copyright © 2015 - 2017, NT-MDT SI