AFM - Raman - SNOM
Modular AFM
Automated AFM
Practical AFM
Practical AFM


The Highest Performance AFM for everyone
Fully automated AFM/STM system NEXT. NT-MDT – AFM-probes, atomic force microscope (AFM, STM, SPM, RAMAN, SNOM)
TITANIUM brochure (2.92 Мб)

Multiprobe Cartridge Leaflet (6.60 Мб)
Applications Specifications Accessories Downloads Contact Us

The Highest Performance AFM

The TITANIUM Atomic Force Microscope (AFM) incorporates revolutionary developments of NT-MDT to provide the highest level of performance and ease of use. Featuring the Revolution Head for Multi-probe Cartridge operation and innovative HybriD mode paired with low noise and low drift performance TITANIUM sets a new standard in atomic force microscopy

High Resolution Imaging

Highly stable system design paired with industry lowest drift and noise values give utmost performance for routine high resolution imaging with TITANIUM.

Although first AFM was introduced more than 25 years ago, high resolution imaging is still driving strong competition amongst AFM manufacturers. Outstanding for commercial systems thermal stabilization and 25 fm/Hz noise level of TITANIUM OBD sensor makes high resolution imaging a routine procedure.

F14H20 molecular
chains on HOPG, AM-AFM
HOPG atomic
lattice resolution, STM
Calcite atomic
AM-AFM in liqud




Main features

Routine Atomic Resolution
  • Low Drift 0.2 nm/min
  • Low noise 25 fm/Hz
  • Revoution Head for automated probe exchange
  • MultiFrequency Techniques

Advanced characterization techniques

  • 5 Lock-in amplifiers
  • Fully digital architecture for higher flexibility
  • Up to 8 scanning channels
  • Automated system configuration
  • Low HV noise < 5 uV/Hz

Fully digital architecture provides full flexibility in custom setups while maintaining the high level of automation for inexperienced customers. Unique electronic design solutions and high performance electronic components provide an unbeaten level of signal to noise in most critical circuits of AFM as optical beam detection system and piezo drivers.


Revolution Head

  • 38 tips on Cartridge
  • Fast tip exchange
  • Automated operation
  • Choice of tips on Cartridge
  • Safe handling
  • Reduced tuning time
  • Maintains scanning area

Faster than ever cantilever exchange with Revolution HeadTM sets a new standard in AFM usability.


Fully automated operation minimizes system tuning time leading to fast and easy AFM imaging at any level of user skills.

HybriD Mode™

HybriD Mode™ (HD-AFM™ Mode) is a new AFM technique that opens new dimensions to investigate the nanoworld. Real-time detection of cantilever deflection allows to collect topographic, mechanical and electrical properties at the same time with high quality and spatial resolution.
Lear more on HybriD mode™ webpage.


Low drift on F14H20
Monodomain BFO sample
PnBA molecules on mica
SDRAM structure

AM-AFM, Height. 500х500 nm

AM-AFM, Height. 60х60 nm

54 min. later. 60х60 nm

VPFM, Amplitude. 3x3 um

VPFM, Phase. 3x3 um

Single-pass KPFM. 4x4 um

Contact AFM, Height. 3x3 um

HD mode, Height. 300x300 nm

HD mode, Adhesion. 300x300 nm

AM-AFM, Height. 300x300 nm

AM-AFM, Phase. 300x300 nm

AM-KPFM, Surface potential. 40x40 um

AM-AFM, Height. 40x40 um

Calcite atomic resolution
Bi-Sn Alloy
HOPG atomic lattice resolution
Rabbit tendon collagenss
in water
AM-AFM in liquid.
Scan size 7×7 nm

AM-AFM, Topography. 10x10 um

KPFM, Surface potential. 10x10 um

KPFM, Surface potential

HD mode, E Modulus. 10x10 um

HD mode, E Modulus

STM. Scan size 2.1×2.1 nm

HDTM Mode. Topography. 5x5 um

HDTM Mode. Topography. 2x2 um


Measuring heads

Revolution HeadTM for Multi-probe Cartridges. Enables Automated Cantilever Replacement with Full Tuning.
Standard AFM Head for traditional single chip probes for traditional AFM cantilevers. Enables operation with majority of commercial probes.
AFM Head for Liquid Studies
STM Head


Type: Tube Scanner with Closed Loop Sensors, Scanning by Sample
Scanning range, XYZ:
100×100×10 or 2×2×0.2 in Low Voltage Mode
Closed loop: Available for all Directions: XYZ
Noise: <300pm in XY and <30pm in Z for Closed Loop, <30pm
in XYZ for Opened Loop
Drive electronics noise < 5 uV/Hz

 Tip-Sample Positioning

Type: Motorized Sample positioning in XYZ
XYZ Thermal Drift: <0.2 nm/min
Moving Range: 5×5 mm in XY, 10 mm in Z
Navigation: Place of Interest Saving, Navigation by Mouse
Click on Video Image, 3D Mouse Compatible, Automated Multiple Scanning
Approach: Smart Soft Approach Algorithm

View Module

Type: Motorized Focus, Zoom and XY positioning. Calibrated with Sample and Laser  Position
Resolution: 2μm
Field of View: up to 2×2mm (1 Mpixel), up to 7×7mm using automated panoramic optical view (50 MPixel)
Autofocus: on Cantilever, on Sample
Video Recognition: Cantilever Position
Zoom: Motorized Continuous Optical Zoom


AFM Liquid Head: Contact mode, AC mode, HybriD mode, Spectroscopy
STM Measuring Head: Constant Height and Constant Current Topography, Barrier Height, States Density, I(V) Curves, I(Z) Curves
Nanoindenter Measuring Head: Sclerometry, Indenting, Measuring Approach Curves. Range of Measured quantitaties: 1 - 80 GPa for Hardness, 1 - 1000 GPa for Elasticity modulus
Heating Stage: from RT to 150 C
Signal Assecc Module
+/- 50 V Voltage Extender
AFM tips:
Variety of Single Chip AFM Cantilevers
Multi-probe Cartridges with 38 cantilevers of different types and coatings.


Electronics & Software

Number of scan channels: virtually unlimited. More than 16 independent simultaneous scan channels supported
Signal Processing: 512 Mb Buffer Size, 3x 340 MHz FPGA, 320 MHz DSP
Lock-in Amplifiers: 2x Analog Lock-in Amplifiers, 3x Digital Lock-in Amplifiers (Multifrequeny AFM modes supporting)
Generators: 6x 32 bit Digital Generators, 4x for Lock-in
BV: +/- 10 V AC and DC (Independent Sample and Tip Voltage Supply), +/- 50 V AC and DC (Optional)
Self-testing: automated performance check
Maximum Scan Points: 8000×8000 Points
Scanning Parameters Auto Adjustment: Driving Amplitude, Lock-in Gain, Setpoint, Feedback Gain, Scanning Rate, Advanced Modes Configuration
Automation Features: Optical System Adjustment, Multiple Scanning on 5×5 mm Range with Scan Stitching, Overlay of Optical and AFM images , Panoramic Optical View, Place of Interest Saving, Autofocus on Cantilever, Autofocus on Sample
Programming tools: Nova PowerScript Language, LabWiev Integration

Optical Sensor

Light source: 850nm
Optical System Adjustment: Automated in Air and Liquid
Optical Beam Deflection Sensor Noise: <25 fm/Hz above 100kHz

Instrument Isolation

Thermal Stabilization: Temperature Control in Acoustic Enclosure
Acoustic Isolation: Acoustic Enclosure, Motorized Build-in Protective Cover.
Seismic Isolation: Active Vibration Isolation Table
Routine Atomic Resolution: in air and liquid

Basic Set of Modes

Contact mode: Topography, Lateral Force, Force modulation, Spreading Resistance, Multifrequency Piezo Force Microscopy, Contact Resonance Microscopy.

Amplitude modulation mode: Topography, Phase Imaging, Single and Double Pass Kelvin Probe Force Microscopy with Phase and Amplitude Modulation, Double Pass and Lift Magnetic Force Microscopy, Single and Double Pass Electrostatic Force Microscopy, Single and Double Pass dC/dZ and dC/dV microscopy.

HybriD mode: Topography, Elastisity modulus, Lift and Land Adhesion, Work of Adhesion, Current, Viscoelasticity
Nanolithography: Voltage, Current, Force (All Vector and Raster), Nanomanipulation Spectroscopy: Force-, Amplitude-, Phase-, Frequency-, Current-Distance, I(V), Piezopulse, Custom mode.




STM head

Auxiliary measuring head for Scanning Tunneling Microscopy and Spectroscopy

AFM head for measuring in liquid   

Auxiliary measuring head for Atomic Force Microscopy and Spectroscopy  with open liquid cell for measuring in liquid

Nanosclerometry head

Auxillary head for
  • Nanoindentation
  • Scratch hardness  
  • Elastic modulus mapping

Heating stage

Temperature control of the sample: from the RT up to 150 oC

AFM probes

NT-MDT offers a wide assortment of SPM probes, ranging from the routine silicon and polysilicon cantilevers to ultra-sharp diamond-like carbon tips, probes with different coatings, for magnetic measurements, probes for SNOM and many others:
contact, conductive contact, noncontact and conductive noncontact.



Information brochures:

  1. TITANIUM Brochure (2.92 Мб)


  1. Multiprobe Cartridge Leaflet (6.60 Мб)


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