AFM - Raman - SNOM
Modular AFM
Automated AFM
Practical AFM
Practical AFM
Model line
NTEGRA Spectra NTEGRA Spectra – AFM-Raman-SNOM system. NT-MDT – AFM-probes, atomic force microscope (AFM, HybriD Mode, STM, SPM, RAMAN, SNOM NTEGRA Spectra II SPECTRUM SPECTRUM - Automated AFM-Raman-SNOM system for a wide range of applications


Automated AFM-Raman-SNOM system
for a wide range of applications
SPECTRUM - Automated AFM-Raman-SNOM system for a wide range of applications
SPECTRUM Brochure (11 Мб)

General information

The World’s first fully automated AFM-Raman-SNOM instrument. Integration of AFM with multiple optical techniques: confocal Raman/fluorescence microscopy, SNOM, TERS etc. Comprehensive sample characterization on the nanoscale – easy and fast.

  • Simultaneous AFM and confocal Raman imaging using different objectives (up to 100x).
  • Free rotation of microscope turret (up to 4 objectives) with AFM probe on the sample.
  • Automated removal of AFM probe (for low working distance objectives or when AFM probe is not required).
  • HotSpot – Automatic location of active TERS* region on the probe.
  • Fully automated and easy to use operation.
* Tip Enhanced Raman Scattering.


Step 1 Sample survey (with cantilever removed). High resolution and wide field of view.

Step 2 Simultaneous AFM and confocal Raman/Fluorescence imaging of selected area.

Up to 4 objectives can be installed into the turret of the commercial optical microscope.
All standard imaging modes are supported.

Some AFM modes may require different cantilevers.
Easy probe exchange and automated approach allows any advanced AFM mode (>30 modes) to be readily used together with Raman.

    Topography Overlap of PS and PVAC Raman images
Cantilever automatically
moves to the working
position and lands
    Surface potential Rayleigh scattering


The new SPECTRUM instrument was developed based on NT-MDT more than 15 years experience in building AFM - Raman – SNOM systems. The unique features include: full automation, advanced AFM capabilities, complete integration with optical techniques.

System design & configurations

Fully integrated & optimized AFM-Raman-SNOM-TERS system immersed into an easy-to-use, compact design.

Unique integration of SPM with optics for AFM - Raman - SNOM – TERS

  • Upright or Full Transmission configuration.
  • Upright microscope with 4 position revolving turret. Possibility to install up to 4 different objectives starting from the lenses for large area visualization to high numerical aperture objectives for high optical resolution,
  • Scanning by laser spot. This option is provided by very stable scanner-mirror with closed loop capacitance sensors. Latter allows to position the laser spot with a high precision on the tip apex.
  • Fiber or direct input/output of the excitation laser/registered signal. Specially designed optical mechanical unit allows to input the incident laser by using high transmission optical fiber and output the collected signal through the fiber directly to the monochromator. Otherwise it is possible to couple directly Spectrum system with commercially available spectrometers (Solar, Renishaw).
  • SNOM. Due to Full Transmission configuration it is possible to perform aperture and apertureless SNOM using cantilever or fiber probes


  • Sample movement.
  • Laser/cantilever/photodiode system alignment.
  • Automatic removal of AFM probe (when low working distance objectives are used or when AFM probe is not required).
  • Probe approach & retraction.
  • Scanning parameters adjustment.

Unique SPM capabilities

  • Low noise. Sample scanning with resolution down to atomic.
  • Large sample size (up to 50mm×50mm). Special sample holder for slides (75mm×25mm).
  • AFM, STM and tuning fork operation; measurements in liquid.
  • More than 30 advanced SPM modes supported - together with Raman. 
Tuning fork tip holder
AFM tip holder
STM tip holder
Holder for operation in liquid

System design

  1. Specialy designed OMU with optical viewing system and scanner-mirror
  2. Mitutoyo Upright microscope
  3. 4 position turret 100х objective
  4. SPM head with tip holder and AFM cntilever deflection system
  5. SPM base wich includes: Piezo Scan Stage (100um*100um*10um) Motorized Stage (35mm*35mm) Manual positioner of SPM head (3mm*3mm) Motorized and Piezo drives for Z objective (optional) Heating stage (optional)
  6. SNOM unit (optional)

Upright+Scanner-mirror (Standart configuration)

  1. Dual Scanning system (3 independent closed-loop scanning axes by sample + 2 by laser spot)
  2. Designed for nontransparent samples
  3. Optical resolution down to 280nm symultaneously with AFM
  4. Signal collection is performed by high numerical apperture objective simultaneously with AFM
  5. Laser scanning for automatic location of active TERS region on the probe
  6. Equipped with heating stage.

Configuration SNOM unit (Optional)

Special unit for fiber input/output, and motorized drive for bottom objective. Objectives with different magnifications can be used
2 modes:

  1. Transmission: detection with PMT of the signal collected with the bottom objective
  2. Collection: Exitation with laser from the bottom, collection of the signal with cantilever aperture and registration with the spectrometer detectors




Sample survey with high resolution. Automated high resolution AFM - Raman imaging without limitations of the piezo-scanner range.


High-precision positioning motors allow to automate basic operations, including the adjustment of the OBD system, positioning of measuring heads and sample, etc.
  1. Choosing area on the sample (any size, no limitations of the scanner).
  2. Automated AFM probe approach.
  3. Simultaneous measurement of AFM and confocal Raman/fluorescence maps from multiple areas (automated).
  4. Image stiching (automated).
Рамановское изображение
(на центре тяжести Siполосы)
АСМ изображение
Широкопольное изображения
высокого разрешения
Рамановское изображение
(на Siпике)
Automated sample positioning (35×35 mm)*
High precision positioning motors equipped with optical sensors allow automated AFM-Raman imaging of any sample areas (within 35mm×35mm travel range).
Cantilever deflection system auto alignment
In several seconds get the laser aligned to the tip and photodiode position optimized. Special algorithms give a high precision and high speed of cantilever deflection system alignment.




  • Graphene, carbon nanotubes and other carbon materials
  • Semiconductor devices
  • Nanotubes, nanowires, quantum dots and other nanoscale materials
  • Polymers
  • Optical device characterization: semiconductor lasers, optical fibers, waveguides, plasmonic devices
  • Investigation of cellular tissue, DNA, viruses and other biological objects
  • Chemical reaction control

Mo oxide nanowires, 5 ×5 µm

CdS nanowires, 4 ×4 µm


Mo oxide Raman peak


Fluorescense image

Overlapped Raman image
from CdS and PANI

Artificial diamond characterization, 2 ×2 µm

Graphene, 5 ×5 µm

AFM topography

Raman mapping of intensity
of 1333 1/cm band


Raman map of 2D-band

Raman map of G-band



Measuring modes and techniques

AFM (contact and amplitude modulation), AFM spectroscopy, AFM lithography (force, current, voltage), Raster Spring Imaging, Lateral Force Microscopy, Force Modulation Microscopy, Scanning Spreading Resistance Microscopy, Piezoresponse Force Microscopy and Switching Spectroscopy, EFM, Kelvin Probe Force Microscopy, MFM, STM (microscopy, spectroscopy, lithography).

Confocal Fluorescence microscopy, Confocal Raman microscopy, Confocal Rayleigh microscopy, TERS, TEFS, Wide field optical microscopy, SNOM (all types of probes, all modes)

More info


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