Atomic Force Microscopy for Nanotechnology, Scientific Research & Education

СОЛВЕР Nano
AFM - Raman - SNOM
Modular AFM
Automated AFM
Practical AFM
Practical AFM
Fully automated AFM/STM TITANIUM.  NT-MDT - AFM-probes, atomic force microscope (AFM, STM, SPM, RAMAN, SNOM)
New AFM technique
Comprehensive materials characterization
Ultimate resolution, quantitative analysis
Morphological, mechanical, chemical, electric, magnetic and
other properties within a single scan

Compatible with: NEXT, NTEGRA Prima, NTEGRA Spectra,
SPECTRUM and LIFE systems
Atomic Force Microscope for Research & Education
SOLVER Nano &ndash Atomic Force Microscope for Research & Education
Interdisciplinary research at the nanometer scale:
AFM+Confocal Raman+SNOM+TERS
NTEGRA Spectra – Atomic Force Microscope integrated with Confocal Raman and  SNOM systems
Fully automated Atomic Force Microscope
integrated with Inverted Light Microscope
for Biological Research
LIFE – Fully automated Atomic Force Microscope integrated with Inverted Light Microscope
  • Record breaking Raman enhancement factors
  • Nano-Raman spatial resolution: down 10nm
  • High speed TERS mapping
  • Mass produced, based on serial AFM cantilevers
Automated AFM-Raman-SNOM system for a wide range of applications
 
12.10.2016

 

Dublin, Ireland. April, 24-28, 2017

Strasbourg,France. May, 22-26, 2017

Manchester,UK. July, 3-6, 2017

Cambridge Unoversity,UK. November, 2-3, 2017
 

Webinars

Upcoming webinar

NT-MDT is delighted to invite you to attend  the February US Webinar presented by
Dr. Sergei Magonov:

High-Resolution and Quantitative AFM Mapping of Mechanical Properties of Polymers 

When: 12 February 11am MST

Where: In the comfort of your office, home or on the go!

Click here to register:
 https://attendee.gotowebinar.com/register/
6919014831885373698

Webinar ID: 123-101-859

Archived webinars 
    Beyond the Diffraction Limit: AFM Integration with
    Light
   Please click here to view the webinar

Unique cantilever-type TERS probes for
nano-Raman imaging

Record Raman enhancement factors, highest nano-Raman spatial resolution and excellent AFM performance. Read more
Image of TERS probe
 
New ETALON series AFM probes with CoFe coating
for ultra-high-resolution MFM
3x3 um AC-MFM image of high-density HDD surface reveals at least 30 nm resolution.
Read more
Image of TERS probe
 
 
 
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